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| WEDNESDAY, June 9, 2004, 2:00 PM - 4:00 PM | Room: 4 | ||
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TOPIC AREA: LOGIC DESIGN AND TEST | ||
| SESSION 30 | |||
| Advanced Test Solutions | |||
| Chair: Paolo Prinetto - Politecnico di Torino, Torino, Italy | |||
| Organizers: TM Mak, Yervant Zorian | |||
| Novel and efficient solutions to test for very deep submicron chips are presented in this session. These solutions address a number of optimization factors, including: reducing power, identifying critical paths, diagnosing FPGA's faults and optimizing silicon debug. | |||
 30.1 |
On Path-Based Learning and its Applications in Delay Test and Diagnosis |
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| Speaker(s): | Li-C. Wang - Univ. of California, Santa Barbara, CA | ||
| Author(s): | Li-C. Wang - Univ. of California, Santa Barbara, CA TM Mak - Intel Corp., Santa Clara, CA Kwang-Ting Cheng - Univ. of California, Santa Barbara, CA Magdy S. Abadir - Motorola, Inc., Austin, TX | ||
| 30.2 | Efficient On-Line Testing of FPGAs with Provable Diagnosabilities | ||
| Speaker(s): | Shantanu Dutt - Univ. of Illinois, Chicago, IL | ||
| Author(s): | Vinay Verma - Xilinx, Inc., San Jose, CA Shantanu Dutt - Univ. of Illinois, Chicago, IL Vishal Suthar - Univ. of Illinois, Chicago, IL | ||
| 30.3 | On Test Generation for Transition Faults with Minimized Peak Power Dissipation | ||
| Speaker(s): | Wei Li - Univ. of Iowa, Iowa City, IA | ||
| Author(s): | Wei Li - Univ. of Iowa, Iowa City, IA Sudhakar M. Reddy - Univ. of Iowa, Iowa City, IA Irith Pomeranz - Purdue Univ., West Lafayette, IN | ||
| 30.4s | A New State Assignment Technique for Testing and Low Power | ||
| Speaker(s): | Sungju Park - Hanyang Univ., Ansan, Republic of Korea | ||
| Author(s): | Sungju Park - Hanyang Univ., Ansan, Republic of Korea Sangwook Cho - Hanyang Univ., Ansan, Republic of Korea Seiyang Yang - Pusan Univ., Pusan, Republic of Korea Maciej Ciesielski - Univ. of Massachusetts, Amherst, MA | ||
| 30.5s | Automatic Generation of Breakpoint Hardware for Silicon Debug | ||
| Speaker(s): | Bart Vermeulen - Philips Research Labs., Eindhoven, Netherlands | ||
| Author(s): | Bart Vermeulen - Philips Research Labs., Eindhoven, Netherlands Mohammad Z. Urfianto - Royal Institute of Tech., Kista, Sweden Sandeep K. Goel - Philips Research Labs., Eindhoven, Netherlands | ||
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